This is a listing of the QIMT course modules from the MIMT acquistion that either are available or are in re-write and will be released as soon as they are ready.

Each module consists of several lessons to be completed on-line with our unique online training methods and student support. The following will provide detailed information as to the technical coverage of each module.


The following descriptions briefly review the text material content of the QIMT subjects offered in each module. The hours, prerequisites and number of assignments provided beneath each description indicate the number of tests and/or submitted work for grading. Although prerequisite modules are suggested for a well-rounded technical training program, they may be omitted if the trainees have practical experience or previous training in that subject material.


0100 Basic Mathematics

Covers the mathematics needed for the study of basic metrology. Subjects include signed and general numbers, equations, ratios and proportion, exponents and radicals, binary and octal numbers, vectors, powers of ten and trigonometry.
Hours: 36: Prerequisites None Assignments: 5

0110 Advanced Mathematics

Covers the mathematics required for the study of electrical metrology. Discusses the composition of a number and describes detailed notation of imaginary numbers. Discusses the j operator, the mathematical manipulation of complex numbers, and the conversion between polar and rectangular coordinate systems. Describes the composition of a logarithm, the natural system of logs, the use of log tables, and mathematical operations utilizing logs.
Hours: 18: Prerequisites 0100 Assignments: 2

0200 Electrical Concepts

Introduces basic electrical concepts essential to electrical measurement. Describes ac and dc parameters such as voltage, current, power, resistance, reactance, phase and frequency. Instructs and provides exercises in Ohm's and Kirchoffs laws. Describes the basic instruments used to measure voltage, current, resistance, time, frequency, power and modifiers such as dividers and shunts. Discusses electrical power, including sources, transfers and measurement. Introduces instantaneous parameters and elementary waveforms in both the frequency and time domains.
Hours: 18 Prerequisites: 0100 Assignments: 6

0300 Electronic Concepts

Defines electronic functions and discusses basic electronic circuitry, decibels (and dBm) phase angle and impedance. Introduces resonance, Q and D factors, networks, and equivalent circuits. Continues the discussion of waveforms to include more complex forms, distortions and noise Introduces the student to time domain concepts via a discussion of pulse characteristics and equivalent frequency bandwidths.
Hours: 15 Prerequisites: 0110 & 0200 Assignments: 6

0400 Solid State Components

Introduces to solid state physics applicable to electronic metrology. Discusses atomic structure, energy levels and bands, and the theory of holes and electrons. Describes both single and multi­ layered-layered junctions, diodes and transistors in most configurations. Discusses methods of biasing and stabilizing transistors including a discussion of transistor parameters. Discusses the instrument applications of specialized semiconductor devices such as silicon controlled rectifiers, Shockly diodes, semiconductor switches, i transistors, field effect transistors, photo transistors, and operational amplifiers. The utilization of these semiconductor devices in circuits such as oscillators, buffers, multi-layered-vibrators, etc., is also considered.
Hours: 18 Prerequisites: 0300 Assignments: 8


1100 Basic Metrology

Introduces to the science of metrology. Describes measurement units and standards; discusses significant figures and rounding. Presents the measurement system including standard procedures and errors associated with the use of test, measuring and diagnostic equipment. Describes the administration and control of a typical calibration program.
Hours: 24 Prerequisites: 0100 Assignments: 8

1200 Measurement Overview

Provides a general description of measurements in the dimensional, physical and electrical disciplines. Instruments used to perform linear, configuration, electrical and physical, (temperature, force, pressure, torque and rotation) measurements are discussed. The causes of typical measurement errors are also reviewed.
Hours: 30 Prerequisites: 1100 Assignments: 10

1500 SI System

Introduces metrication in the United States including its history. Discusses advantages and disadvantages of the metric system and the associated conversion problems. Presents the International System of Units (SI) and the relationship of that system to physical and dimensional measurements such as mass, force, torque, pressure and linear.
Hours: 21 Prerequisites: 1100 Assignments: 6

1600 Electronic Process Control

Provides practical information on electrical and electronic fabrication and assembly. Covers the manufacture of components such as resistors and capacitors, the process controls necessary to maintain optimum yield, and the stresses encountered during fabrication and testing. Presents printed circuit board fabrication emphasizing failure modes due to under and over-etching. The tighter process controls required as the complexity of the board increases from single-sided to multi- layered is also discussed. Large System Integration (LSI) device fabrication is also described to highlight the special techniques required to produce and handle these devices such as bonding, hermetic sealing and electrostatic grounding. Introduces board assembly techniques, subassemblies and systems assemblies. Other topics include automatic component mounting, back plane wiring, wire wrap, termipoint, connectors and cables, encapsulation techniques, wave soldering, process controls and documentation reviews.
Hours: 36 Prerequisites: 1200 Assignments: 12

1700 Mechanical Process Control

Presents production techniques and procedures in various mechanical processes. Discusses control considerations associated with the fabrication, assembly, handling, and preservation of metals, plastics, ceramics, metallic and nonmetal composites, and other bonded items in production facilities. Raw material acquisition, receiving inspection, storage handling and control are also discussed. Government and commercial specifications applicable to the processes are reviewed.
Hours: 30 Prerequisites: 1200 Assignments: 10


2100 Basic Physical Metrology

Provides the technical foundation essential for the study of physical measurement instruments and systems. Describes the 13 basic physical parameters, including concurrent and non-concurrent forces, work, energy, power, and uniform motion related to physical measurements. Also discusses the principles of electrical indicating devices in the performance of physical measurements.
Hours: 27 Prerequisites: 1100 Assignments: 3

2120 Temperature & Humidity Instruments

Reviews temperature and humidity concepts and describes instruments used to measure these parameters. Defines temperature scales, linear and volumetric expansion and the behavior of gases. Explains the theory, application and calibration of temperature and humidity measurement devices including associated errors and corrections.
Hours: 12 Prerequisites: 2100 Assignments: 2

2130 Pressure Instruments

Briefly reviews pressure concepts, discusses fluid columns and the theory of pressure transmission. Describes basic pressure instruments including manometers, barometers, bourdon tube gages, pressure switches and isolation valves. Also provides a general discussion on the hazard of testing or calibrating pressure devices.
Hours: 12 Prerequisites: 2100 Assignments: 4

2140 Torque Instruments

Discusses the application of torque principles and describes the different types of torque wrenches, adapters, extensions and torque screwdrivers. Also discusses the instruments used to calibrate this equipment including the torsion bar tester, calibration arm and mechanical loader.
Hours: 9 Prerequisites: 2100 Assignments: 3

2150 Rotational Motion Instruments

Reviews the basic principles of equilibrium and angular velocity, dynamic torque and power. Discusses the operation principles and construction of tachometers, stroboscopes and gyroscopes. Describes rotational power measurement techniques and the calibration of rotational motion instruments.
Hours: 9 Prerequisites: 2100 Assignments: 3

2160 Force Instruments

Provides a review of elastic devices and describes the us-e of springs in force measuring instruments. Discusses the relationship of mass to weight and the traceability of mass standards. Explains the theory and operation of instruments used to measure mass and discusses the use of equal arm and single pan balances.
Hours: 15 Prerequisites: 2100 Assignments: 3

2170 Viscosity & Specific Gravity Instruments

Reviews and expands on the principles of absolute and kinematic viscosity, Newtonian fluids and temperature effects. Provides a comprehensive discussion of viscosity units, types of viscometers, standard oils and viscometer calibration. Discusses specific gravity and related measuring instruments.
Hours: 18 Prerequisites: 2160 Assignments: 4

2180 Liquid Level Measurements

Introduces major types of liquid level detectors, both inferential and direct reading, discussing the applications and limitations of each. Describes hydrostatic effects and other factors which influence liquid level readings taken with pressure sensitive detectors. Provides exercises with correction factor problems involving pressure detectors. Covers the principles and application of systems utilizing electrical capacitance for liquid level measurements and combination systems such as thermal-hydraulic types.
Hours: 15 Prerequisites: 2100 Assignments: 3

2220 Temperature Systems

Describes systems used for the measurement of temperature. Discusses temperature compensation requirements, data interpretation and calibration criteria for liquid, gas and vapor-filled systems, resistive temperature devices and optical and radiation pyrometers.
Hours: 18 Prerequisites: 2120 Assignments: 4

2230 Pressure Systems

Describes the construction and application to transducers used to convert pressure into an electrical signal or other measurable parameter. Typical transducers discussed include the strain gage, potentiometric, variable reluctance, capacitive and force balance types. Discusses the construction, operation and application of pressure activated switches, vacuum gages (i.e., McLeod, thermal conductivity, Pirani, ionization) and air and liquid dead weight piston gages.
Hours: 21 Prerequisites: 2130 Assignments: 4

2240 Force Systems

Describes the construction and application of systems used in the measurement of force. Systems covered include proving rings, ring dynamometers, strain gages, load cells and load cell systems, aircraft weighing kits and universal testing machines. Discusses calibration considerations and correction requirements.
Hours: 18 Prerequisites: 2160 Assignments: 4

2250 Flow Systems

Develops liquid and gas flow concepts using energy conversion principles and Bernoulli's Theorem. Discusses the theory of compressible flow and the venturi, nozzle orifice, elbow and pitot tube. Describes classifications, uncertainties and operating principles of various flowmeters.
Hours: 18 Prerequisites: 2120, 2130 & 2170 Assignments: 2

2410 Scales

Introduces basic weighing principles involved with levers and load cells. Discusses operating principles, repair and calibration of fan scales, bench and portable scales, and load cells. Electronic scales are also discussed with the K-tron Model DS-1 and Toledo Models 2085 and 3185 used as representative examples.
Hours: 18 Prerequisites: 2160 Assignments: 5

2420 Balances

Introduces the basic principles of mechanical, electronic and capacity balances, then discusses weighing machines and the use of mass units. Explores mass standard, universal gravitation and buoying as they are employed in balance instrumentation. Operating principles, major subassemblies, troubleshooting, adjustments and final checkout are all discussed in detail for mechanical analytical balances, top loading mechanical balances, top loading electronic balances and electronic microbalances.
Hours: 21 Prerequisites: 2160 Assignments: 7


3100 Electrical Measurement Instruments

Introduces basic electrical measurements and the devices commonly used to perform these measurements. Describes the construction and application of various direct deflection meters. Discusses resistance measurements and resistance measuring techniques and devices, including common bridges and their associated guard circuits. Discusses the measurement of both direct and alternating voltage and current. Familiarizes the student with electrical meter maintenance/repair.
Hours: 18 Prerequisites: 0100 & 1100 Assignments: 6


4100 Linear Measuring Instruments

Defines the basic linear measurement parameters and their characteristics. Describes basic measuring and inspection instruments and the standards used in linear measurements. Discusses operating principles, instrument applications and important calibration considerations. Included is a comprehensive description of linear measurement errors, potential causes and estimated magnitudes.
Hours: 18 Prerequisites: 1100 Assignments: 4

4200 Configuration Measurements

Introduces the concepts of measurement through a discussion of basic measurement methods. Several measurement systems are then described: electronic gage, internal comparator, height setting gage, electronic level, bench center, bench micrometer and standard measuring machine, toolmaker's microscope, optical comparator and angle setting table. Configuration measurement techniques such as straightness, squareness, roundness and sphericity, concentricity, surface texture, threads, tapers and optical projections are treated in detail throughout the latter 60% of this module.
Hours: 20 Prerequisites 4100 Assignments: 3


5100 Optical Measuring Instruments

Deals with the measurement of length, angle and deviation by the establishment of one or more lines of sight. Discusses basic principles of optics including reflection, refraction, resolution and distortion. Describes the optical-tooling geometric concept and the operating principles of optical- tooling instruments and accessories. Instrument application, calibration and potential errors associated with optical-tooling are also covered.
Hours: 21 Prerequisites: 1100 Assignments: 4

5200 Optical Measurement Systems

Describes the role of optical measurement systems and discusses the scope of current technology. Leveling systems are introduced with a discussion of general theory. Two systems are then treated in detail: spirit levels and telescope levels, with special emphasis on telescope level application. Introduces surveying systems and discusses horizontal distance measurement and angle measurement. Describes basic optical tooling systems and discusses planning, tooling bars and docks, and optical tooling applications. Laser principles are treated in-depth with special emphasis on laser technology applied to surveying, optical tooling and laser system applications.
Hours: 21 Prerequisites: 5100 Assignments: 5

5300 Photometry

Introduces basic photometry principles and discusses some of the more important concepts involved in optical measurement: radiation, vision, photometry, vision sources, detectors and photometric amplifiers. Describes luminous intensity measurements in terms of bench photometry, bench measuring techniques, specialized bench applications, photometric cells in bench photometry and screens. Also discusses luminous flux measurements. Introduced to the integrating sphere, methods of using integrating spheres, physical requirements of spheres and miscellaneous photometric measurements. Describes several aspects of photometry systems: practical substandards, the sphere and its peripherals, lamp power and monitor, phometer amplifiers and a variety of typical photometric systems.
Hours 12 Prerequisites: 0300/1100 Assignments: 4


6100 Electronic Measurement Instruments

Discusses the measurements of time and frequency including their interrelationship and conversion. Introduces electronic voltmeters and their derivations including the digital types, review operation, noise and waveform factors. Describes oscilloscopes and their component elements; defines various alternating current bridges used for reactance and impedance measurement; and, discusses phase angle measurement techniques. Covers signal sources including oscillators, synthesizers and function (special waveform) generators. Introduces electronic counters and their application. Discusses specifications and calibration of both generators and counters.
Hours: 21 Prerequisites: 0400 & 3100 Assignments: 5

6200 Electronic Measurement Systems

Discusses the concepts and applications of measurement on distributed constants systems; compares them to the measurement on lumped constants systems. Describes the generation and control of RF signals including stabilization, modulation and attenuation. Introduces systems for the transfer between time and frequency domains including sampling oscilloscopes and spectrum analyzers. Discusses time and frequency measurement systems and sources including a review of the correlative services provided by the NIST. Introduces measurements peculiar to microwave and interactive instrumentation. References the Inter-Range Instrumentation Group (IRIG).
Hours: 21 Prerequisites: 6100 Assignments: 5


7100 Electrolytic Measurement Instruments

Discusses basic electrolytic measurement principles. Introduces solutions and electrolytes; defines solvents, solutes, acid bases, salts and ionic concentrations (including pH). Describes the function, operating principles, construction and maintenance of sensitive electrodes, reference electrodes and electrodes for special applications, discusses temperature relationships to pH, correcting factors and compensation devices. Defines conductivity, specific conductivity, cell constants and cell geometry and reviews various conductivity cells and their maintenance. Discusses the standard solutions used for calibration of the cell constants. Discusses the principles and application of polargraphy. Defines half-wave potential, diffusion currents and mercury dropping electrodes.
Hours: 18 Prerequisites: 0300 & 1100 Assignments: 4

7220 Spectroscopy

Provides an introduction to spectroscopy. Discusses the concept of spectroscopy including the electromagnetic radiation spectrum radiation phenomena and absorption theory; define basic parameters and terms including wave numbers, wavelength concentration and transmittance. Describes the application of the Beer-Lambert Law and its relationship to quantitative spectrometrics. Discusses stray light, signal to noise ratios spectrometric resolution and other factors limiting optimum results in spectrometry. Defines principles of operation, the function of major components and the application of-spectrophotometers, fluorimeters, refractometers and spectrometers.
Hours: 18 Prerequisites: 0300 & 7100 Assignments: 3

7230 Chromatography

Provides an introduction to chromatography. Discusses basic concepts including column separation theory, chromatographic identification, quantification interpretation. Discusses the principle applications and limitations of both gas and liquid chromatography; describes the functions of major components in each system. Provides an insight into basic chromatographic techniques essential to accurate measurements and describe common sources of errors.
Hours: 18 Prerequisite: 0300 & 7100 Assignments: 3

7300 Process Controllers & Recorders

Introduces basic instrumentation used to control physical a chemical processes in manufacturing. Describes the six basic modes of control: Two-position, floating, proportional, proportional plus rate (integral), proportional plus rate (derivative), and proportional plus rate plus reset. Discuss the various types of sensors and switches used in process control systems (including their relative advantages), the transmitter receivers and converters used with them. Discusses the feedback loops and servo systems, frequency and transcient response, anticipatory and delay intervals, and position time and current proportioning. Reviews practical process control and recording systems for various process variables, including pressure temperature and flow.
Hours: 18 Prerequisites:0300 & 3100 Assignments: 4

7410 Titrators

Discusses the background and early evaluation of titration concepts as preparation for the introduction of system components and the development of titration systems. System maintenance is discussed in terms of overall maintenance and calibration, mechanical maintenance, and assembly/disassembly precautions. As an example of an important development in titration, the Karl Fischer system is discussed with emphasis on electrode care, calibration and maintenance.
Hours: 15 Prerequisites: 7300 Assignments: 4

7430 Chromatographs

Reviews important terms and concepts of chromatography with special emphasis on resolution and quantitative methods. Introduces gas chromatography and discusses in detail mobile phases, detectors, columns, sample inlet systems, ovens, troubleshooting, safety, and calibration of equipment components. Liquid chromatography is also treated in depth with emphasis of columns, mobile phases, pumps gradient, elution, sampling devices, detectors, troubleshooting and laboratory safety. Discusses system and component maintenance, symptoms of improper operation and the tests and procedures used to troubleshoot, locate and correct malfunction. Chromotographics are illustrated, possible sources of problems indicated, and recommended remedial action described.
Hours: 18 Prerequisites: 7230 Assignments: 3

7440 Spectrometers

Introduces the theoretical concepts necessary to understand a variety of currently available spectrometers. Defines ultraviolet-visual, infrared, fluorescence, polarimeters, nuclear magnetic resonance, mass and atomic as major classes of spectrometers. Discusses sources of error encountered and general adjustments and calibration methods. Describes typical system failures and symptoms of malfunction and discusses general troubleshooting procedures for locating and correcting malfunctions. Describes the procedures for replacement of components and parts and the accomplishment of both minor and major repairs. Describes the hazards associated with each class of spectrometer and prescribes the safety precautions to be observed during troubleshooting and maintenance operations.
Hours: 30 Prerequisites: 7220 Assignments: 7


8100 Materials Testing

Provides an overview of nondestructive and destructive testing techniques and equipment. Defines universal terminology and describes inspection and test methods including magnetic particle, penetrant, radiographic, eddy current, ultrasonic and electrified particle. Stress coat and strain gages are also covered.
Hours: 24 Prerequisites: NONE Assignments: 6

8200 Environmental Testing

Primarily oriented toward Department of Defense requirements, this module describes the principles and techniques employed in testing the effects of environment on the quality of electronic and mechanical systems. Provides an overview of the equipment available for use in environmental testing. Test planning and test operations are also discussed.
Hours: 24 Prerequisites: NONE Assignments: 4

8300 Automatic Testing

Provides an introduction to fundamental automatic testing covering the basic types of systems from bench-top to stand-alone. Discusses the need for automatic test equipment and peripheral equipment for data storage, retrieval and readout. Describes interface techniques via lead translation boards, firmware or switching matrices. Discusses the most common interface problems encountered. Describes the application of automatic testing equipment in typical systems.
Hours: 40 Prerequisites: NONE Assignments: 6

8400 Acquisition of Automatic Testing Systems

Provides an introduction to specific criteria utilized by various agencies in the acquisition of automatic testing systems. Reviews basic testing fundamentals including hybrid system testing, functional testing, fault isolation, pattern sensitivity and self-test. Discusses the economics of automatic testing systems and the procurement of typical ROM/RAM and LSI testers.
Hours: 21 Prerequisites: 8300 Assignments: 7


9100 Introduction to Quality Control

Provides a brief review of the evolution of quality assurance, emphasizing the growth of the quality organization in step with functional growth. Describes quality assurance requirements for each phase in the life cycle of a product. Discusses the function of the typical quality assurance organization and the interrelationship of that organization with the engineering and production elements of the product manufacturer. Describes inspection operations and the collection, recording and use of technical data in configuration control and quality assurance.
Hours: 21 Prerequisites: NONE Assignments: 7

9120 Quality Assurance Audit Techniques

Describes the types of audits conducted to review the capabilities of a quality assurance program. Discusses the audit organization and the function of team members, including consultants, and describes preparations and area assignments for the audits.
Hours: 24 Prerequisites: NONE Assignments: 8

9300 Quality Assurance Statistics

Introduces probability concepts through a brief discussion of sets, combinations, permutations and the primary rules that form a basis for the development and application or probability theory to the overall quality function. Discusses selected areas descriptive statistics with primary emphasis on data interpretation, measures of central tendency, dispersion and frequency distribution. Describes statistical distributions in general and discusses the particular application of the normal, binomial, poison and hypergeometric distributions to solve quality assurance problems.
Hours: 21 Prerequisites: 0110 Assignments: 3

9400 Applied Quality Assurance Statistics

Discusses quality assurance responsibilities in terms of historical perspective with emphasis on inspection records, feedback information, the consumer, the supplier and the consumer vs. the supplier relationships. Explores sampling concepts through defining selected terms and discussing inspection methods, product submission, lot size and inspection severity. Describes sampling in general terms and addresses constant interval and stratified sampling in detail. Discusses various types of sampling plans and defines Average Outgoing Quality Limit (AOQL) and Acceptable Quality Level (AQL). Describes Operating Characteristic (OC) curves in terms of sampling risk and then discusses the construction and use of OC curves. Introduces basic control chart concepts and explores the application of control charts as tools to manage both variable and attribute sampling data.
Hours: 24 Prerequisites: 0110 Assignments: 4

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